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교수소개

교수소개 - 전자전기공학

  • 부교수 반도체 CAD
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    Lab 차세대 반도체 소자 연구실

관심분야

Semiconductor CAD (Device Simulation, Circuit Modeling and Design automation)

학력

  • (B.S) Electrical Engineering, Sungkyunkwan University, Suwon, Korea, 2004.02
  • (Ph.D) Electrical Engineering, Seoul National University, Seoul, Korea, 2009.08

약력/경력

  • Senior Engineer, Semiconductor R&D Center, Samsung Electronics, 2009.09-2016.02.
  • Principal Engineer, Semiconductor R&D Center, Samsung Electronics, 2016.03-2017.08.
  • Assistant Professor, Konkuk University, 2017.09-2021.08
  • Associate Professor, Konkuk University, 2021.09-2023.08
  • Associate Professor, SungkyunKwan University, 2023.09-

학술지 논문

  • (2026)  Investigation of TMDC-based Impact-Ionization Field Effect Transistor (I2-FET) for Low Power Logic.  Results in Physics.  87,  1
  • (2026)  Investigation on α-particle-induced single event effects in AlGaN/GaN HEMTs: Bias, strike location, and trap effects.  AIP ADVANCES.  16,  6
  • (2026)  From Vulnerability to Robustness: Radiation‑Hard Isolation for BPR‑Enabled Stacked Nanosheet CFETs.  NUCLEAR ENGINEERING AND TECHNOLOGY.  58,  1
  • (2026)  3-Tier CFET 6T-SRAM with 2D-TMDs channels for Angstrom technology node.  SCIENTIFIC REPORTS.  16,  1
  • (2026)  Automated, physics-guided AI framework for asymmetry-aware ferroelectric compact models.  SCIENTIFIC REPORTS.  16,  1
  • (2026)  Hot carrier degradation in p-MOSFETs at extremely low to room temperatures (77-370 K).  SEMICONDUCTOR SCIENCE AND TECHNOLOGY.  41,  3
  • (2026)  Lateral Leakage Suppression Using H2 Plasma-Treated SiNx for High-Resolution Organic Displays.  IEEE ELECTRON DEVICE LETTERS.  47,  3
  • (2026)  Advances and Future Challenges in Monolithic 3D Integrated Logic, Power, and Optoelectronics Technologies for Tightly Interconnected Intelligent Systems.  ACS NANO.  20,  8
  • (2026)  Asymmetry-Aware Compact Modeling of Ferroelectric Devices for Circuit-Level Simulation.  ACS APPLIED ELECTRONIC MATERIALS.  8,  4
  • (2026)  Dual-Doped Cylindrical Bit-Line Pad for High-Efficiency Bulk Erase in V-NAND Flash.  IEEE ACCESS.  14,  1
  • (2026)  Line-type tall via structures for CFET: superior scalability and manufacturability through gate extension reduction.  SEMICONDUCTOR SCIENCE AND TECHNOLOGY.  41,  1
  • (2025)  Impact of Interconnect on Ferroelectric FinFET-Based Logic-in-Memory Circuits at 3nm Technology Node.  IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS.  44,  12
  • (2025)  Via-Optimized CFET 6T SRAM: Performance, Stability, Manufacturability, and Scalability.  IEEE TRANSACTIONS ON ELECTRON DEVICES.  73,  1
  • (2025)  Novel vertical contact architecture for significantly reduced contact resistance in 2D nanosheet FETs.  NPJ 2D MATERIALS AND APPLICATIONS.  9,  1
  • (2025)  High-κ dielectric van der Waals integration on 2D semiconductors for three-dimensional complementary logic systems.  NATURE COMMUNICATIONS.  16,  1
  • (2025)  Enhanced programming efficiency in vertical NAND flash using self-boosting hot carrier injection.  SCIENTIFIC REPORTS.  15,  1
  • (2025)  Thermal performance enhancement of complementary field-effect transistors via comparative analysis of power delivery structures.  JOURNAL OF APPLIED PHYSICS.  138,  14
  • (2025)  Enhancing memory performance in IGZO-based 2T0C DRAM through comparative analysis of CAA and GAA FET structures.  JOURNAL OF COMPUTATIONAL ELECTRONICS.  24,  6
  • (2025)  Area-Adjusted Comparison of BSPDN Interconnects in CFET: Superiority of Frontside Connection.  IEEE TRANSACTIONS ON ELECTRON DEVICES.  72,  11
  • (2025)  Investigation of Nanoscale Bonding-Based Complementary FETs.  IEEE TRANSACTIONS ON ELECTRON DEVICES.  72,  9

단행본

  • (2025)  태양광 모듈의 신뢰성 분석.  디자인21.  공동

특허/프로그램

  • Stack structure and manufacturing method thereof, capacitor using the same, transistor using the same, dye-sensitized solar cell using the same, and architectural film for window glass coating using the same.  US20250185407A1.  20250605.  미국

학술회의논문

  • (2025)  FuncFlow: A Generative Neural Operator Using Diffusion Model for Simulation Augmentation.  2025 International Compact Modeling Conference (ICMC).  미국
  • (2025)  Large Pre-Trained Model Approach for Efficient Design Technology CO-Optimization.  2025 International Compact Modeling Conference (ICMC).  미국
  • (2025)  Unified Dynamic Library: Neural Network-Based Compact Modeling for Enhanced Efficiency.  2025 International Compact Modeling Conference (ICMC).  미국
  • (2025)  Electro-Thermal Co-Optimization of 2D Channel-Based Complementary FET Structures.  대한전자공학회 2025년도 하계종합학술대회.  대한민국
  • (2025)  Optimizing Wordline Design for Enhanced Erase Characteristics in Vertical NAND Flash Memory.  대한전자공학회 2025년도 하계종합학술대회.  대한민국
  • (2025)  Optimization of TSV-Induced Stress Using a Slanted Profile in a Backside TSV Process.  International Conference on Electronics, Information, and Communication (ICEIC).  미국
  • (2025)  Optimization of TSV Induced Stress Using a Slanted Profile in a Backside TSV Process.  2025 International Conference on Electronics, Information, and Communication (ICEIC).  일본
  • (2025)  SRAM bitcell Design and Characteristics in the three-stacked CFET structure for CMOS scaling.  2025 International Conference on Electronics, Information, and Communication (ICEIC).  일본
  • (2024)  ANN을 활용한 14nm FinFET BSIM 모델 파라미터 추출.  하계학술대회.  대한민국
  • (2024)  AlGaN/GaN HEMT 소자의 Contact 길이 변화 및 Backside Via 구조 적용에 따른 열 저항의 변화에 관한 3D 시뮬레이션 연구.  하계학술대회.  대한민국
  • (2024)  HZO기반 FeRAM 메모리 어레이 교란성 분석.  하계학술대회.  대한민국
  • (2024)  Optimal data distribution in FeFET-based computing-in-memory macros.  IEEE International Symposium on Circuits and Systems (ISCAS).  미국
  • (2024)  Comparative TCAD Analysis of Single-Event Transients in Forksheet FETs and Bottom Dielectric Isolation-Integrated Forksheet FETs.  한국반도체학술대회.  대한민국
  • (2023)  DAT: Leveraging Device-Specific Noise for Efficient and Robust AI Training in ReRAM-based Systems.  International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).  미국
  • (2023)  FlowSim: An Invertible Generative Network for Efficient Statistical Analysis under Process Variations.  International Conference on Simulation of Semiconductor Processes and Devices (SISPAD).  미국